Aberration corrected high resolution electron microscopy group
International Centre for Materials Science (ICMS)
Jawaharlal Nehru Centre for Advanced Scientific Research
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We have recently acquired one state of the art aberration corrected high resolution transmission electron microscope (TITAN3TM 80-300) from FEI Company, Netherland. This particular microscope has both Cs corrector (spherical aberration, for HRTEM) and probe corrector (for HAADF-STEM) in order to achieve spatial resolution ~ 0.8 Å during imaging of crystals. Acceleration voltage can be varied between 80 kV to 300 kV. Besides, this microscope is equipped with EELS, EDX and energy filter components. In EELS mode, energy resolution better than 0.2 eV allows studying fine details of electronic structure near and extended regions of the absorption edge, providing wide range of information such as coordination, charge state, bonding environment, electronic charge density etc for an atom. Capability in simultaneous imaging in the sub-angstrom level and spectroscopy (atom by atom) is an extremely powerful tool to get direct insight into many of the concepts and controversial issues associated with solid state physics through structure (both crystallographic and electronic) and property correlation. See for more into the research page.